SISS13 Program

June 23, 2011 (Thu)

12:25- Opening remarks

High sensitive detection by laser ionization  12:30-13:40

Matrix effect-free depth profiling of multilayered samples by resonance enhanced multiphoton ionization sputtered neutral mass spectrometry

S. Nishinomiya, N. Kubota, S. Hayashi and H. Takenaka

Multi-element quantitative analysis of Genesis solar wind collectors with Resonance Ionization Mass Spectrometer (Invited talk)

I. Veryovkin

Laser Post-Ionization Secondary Neutral Mass Spectrometry for nanometer scale materials characterization

I. Veryovkin


D-SIMS  13:50-15:50

Precise baddeleyite Pb/Pb and U/Pb isotopic age Determination by Cameca 1280 SIMS (Invited talk)

X.-H. Li, Q.-L. Li, Y. Liu, G.-Q. Tang and J.-H. Yang

SIMS analysis of extraterrestrial materials including the HAYABUSA mission samples (Invited talk)

H. Yurimoto

SIMS Depth Profiling of Ultra-shallow Implants with Oxygen Primary Ions (Invited talk)

Y. Kataoka

Vender session: CAMECA

M. Schuhmacher


TOF-SIMS  16:00-17:30

ToF-SIMS Imaging Analysis of Biological Samples (Invited talk)

T. G. Lee

Application of TOF-SIMS to the direct determination of plant components and introduction of CryoTOF-SIMS/SEM complex apparatus (Invited talk)

K. Fukushima, K. Saito and K. Kuroda

Vender session: ION-TOF “Recent TOF-SIMS and LEIS Developments at ION-TOF”

   M. Terhorst


June 23, 2011 (Thu)

Poster session  17:30-19:00

P-1. TOF-SIMS discrimination of PE / PP thin contamination using multivariate analysis

K. Usugi,

P-2. TOF-SIMS Analysis of Boron and Nitrogen in Steels

K. Kusama, S. Naya, R. Sato and N. Usuki

P-3. An effect of measurement conditions on the depth resolution for TOF-SIMS depth profiling

A. Murase, T. Mitsuoka, M. Tomita, H.Nonaka, H. Takenaka, and H.Morita

P-4. Characterization of the protein damages on the outermosthair surface using TOF-SIMS

M. Okamoto, K. Ishikawa, N. Tanji and S. Aoyagi

P-5. A New Time of Flight SIMS Instrument for3-Dimensional Imaging and Analysis Using Cluster Ion Beams

R. Hill, R. Oiwa, J. S. Fletcher and J. C. Vickerman

P-6. Continuous and Automatic Imaging Analysis on Cutting Cross-Sections of Particulate Matters by FIB-TOF-SIMS

Takahiro Kashiwagi, J. Nakagawa, T. Sakamoto

P-7. Converging of argon cluster ion beams with a glass capillary

K. Shoji, K. Iuchi, K. Moritani, N. Inui, and K. Mochiji

P-8. Ion Bean Stimulated Desorption

T. Kobayashi, S. Toda,Y. Kuwahara and K. Ueda

P-9. Light emission from sputtered or backscattered atoms on tungsten surfaces irradiated by Kr+ ions

N. Nogami, K. Furuya, D. Kato, T. Kenmotsu, K. Motohashi, Y. Sakai, and H. A. Sakaue


June 24, 2011 (Fri)

Atom Probe  10:00-11:20

Anomalous distribution in atom probe tomography data of solute carbon in ferrous steel

Y. Kobayashi, J. Takahashi and K. Kawakami

Combined Analyses of Atom probe tomography and nano-SIMS for the Interface Segregation in Steels (Invited talk)

C. G. Park

Vender session: CAMECA

P. Clifton


Novel primary ion beam  11:30-12:20

High sensitive SIMS with electrospray droplet impact method

S. Ninomiya, L.C. Chen, Y. Sakai and K. Hiraoka

Ambient surface mass spectrometry – developing the metrology for reliable and repeatable measurement (Invited talk)

I. Gilmore

(12:20-13:20 Lunch)

G-SIMS  13:20-14:10

Investigation of G-SIMS Analysis for PEG samples

I. Mihara, M. Kudo and S. Aoyagi

Watching chemistry in 3D & hi-definition using SIMS – from nanostructures to informatics (Invited talk)

I. Gilmore

Cluster Ion Beam  14:10-16:30

Surface sensitive analysis of organic thin films by Ar-gas cluster SIMS

K. Moritani, N. Inui, K. Mochiji

Organic Depth Profiling Using Cluster Beams: C60 and Large Ar Clusters

D. Rading, R. Moellers, M. Terhorst, E. Niehuis


Organic and Biological Material Analysis with Cluster Ion Beams (Invited talk)

J. Matsuo

Clinical applications of SIMS and MALDI-IMS (Invited talk)

M. Setou

Vender session: UIVAC-PHI

T. Miyayama

16:30- Closing remarks