The Scientific International Symposium on Secondary Ion Mass Spectrometry (SIMS) and Related Techniques Based on Ion-Solid Interactions (SISS)
Scope: SISS will cover SIMS and related techniques based on ion-solid interactions: fundamentals, instrumentation, and application in various fields, such as semiconductors, industrial materials, biological, medical, and environmental sciences. We will have mainly three sessions: Atom Probe, D-SIMS, and TOF-SIMS.

SISS Main Website
Committee:
Chair Satoka Aoyagi (Seikei University)
Advisor Masahiro Kudo (Seikei University)
Advisor Hisayoshi Yurimoto (Hokkaido University)
Advisor Jiro Matsuo (Kyoto University)
Akio Takano (TOYAMA)
Atsushi Sakaki (Nichia)
Junichiro Sameshima (Toray Research Center)
Kaori Jogo (Toshiba Nanoanalysis Corporation)
Kousuke Moritani (University of Hyogo)
Makishi Ishikawa (Ametek)
Hiroko Susa (Sony)
Manabu Hashimoto (IONTOF Japan)
Masahiro Taniguchi (Kanazawa Institute of Technology)
Masashi Nojima (Tokyo University of Science)
Masataka Ohgaki (Hitachi High-Tech Science)
Masayuki Okamoto (Kao)​
Naoya Sakamoto (Hokkaido University)
Reiko Saito (Toshiba)
Retsu Oiwa (TOYAMA)
Satoshi Ninomiya (University of Yamanashi)
Shinya Otomo (Furukawa Electric)
Tatsuya Ishikawa (ULVAC-PHI)
Toshio Seki (Kyoto University)
Yasuko Kajiwara (Murata Manufacturing )
Yasuyuki Asahara (Ametek)