Program
July 21, 2005
10:00-10:10
Opening remarks
Masahiro Kudo, Faculty of Science and Technology, Seikei University
10:10-10:40
A Novel Pretreatment Technique of Environmental Samples using Supercritical Fluids for TOF-SIMS Analysis
1Tetsuo Sakamoto, 2,3Masanori Owari and 4Yoshimasa Nihei
1Faculty of Engineering, Kogakuin University, 2Environmental Science Center, the University of Tokyo, 3Institute of Industrial Science, the University of Tokyo, 4Faculty of Science and Technology, Tokyo University of Science
10:40-11:10
Development of Multi-turn Mass Spectrometers
Morio Ishihara, Graduate School of Science, Osaka University
11:10-11:40
Development of Isotope-Microscopy and Implications for Earth and Planetary Science
Hisayoshi Yurimoto, Division of Earth and Planetary Sciences, Hokkaido University
11:40-13:00
Lunch
13:00-13:40
SIMS Molecular Surgery: Recognition of Surface Bonding Structures and Reaction Mechanisms
Che-Chen Chang, Department of Chemistry, National Taiwan University, Taiwan
13:40-14:10
Enhanced Peptide Molecular Imaging by Applying of Droplet Including Ionization-Promoting Agent and Their Quantitative Detection with Bubble Jet Printing Technology
Manabu Komatsu, Youhei Murayama and Hiroyuki Hashimoto
Advanced Analysis Div., Leading-Edge Technology Development Headquarters, Canon inc.
14:10-14:30
Break
14:30-16:45
Poster session
1. TOF-SIMS Analysis of Friction Surfaces Tested in Engine Oil
Atsushi Murase, Hiroyuki Mori and Toshihide Ohmori
Toyota Central R&D Labs., Inc. (Toyota CRDL)
2. Reduction of matrix effects in TOF-SIMS analysis by silver deposition/TOF-SIMS
M. Inoue, A. Murase, Toyota Central R&D Labs., Inc.
3. Simulation of SIMS for Polymers under the Assumption of Thermal Decomposition using QMD Method
K. Endo, T．Ida, N. Kato, H. Sugimoto and D. Matsumoto
Laboratory of Theoretical Chemistry, Graduate School of Natural Science and Technology, Kanazawa University
4. Evaluation of secondary ion yield enhancement from polymer material by using TOF-SIMS equipped with a gold cluster ion source
Kenichi Aimoto, Satoka Aoyagi, Nobuhiko Kato, Noriko Iida, Akira, Yamamoto, Masahiro Kudo, Faculty of Science and Technology, Seikei University
5. Estimation of protein distribution by mean of principal component analysis (PCA) of TOF-SIMS spectra
S. Hoshi, Satoka Aoyagi, Nobuhiko Kato, Masahiro Kudo, Faculty of Science and Technology, Seikei University
6. Applications by TOF-SIMS method for Electronic device materials
Hiroyuki Maeda, Sachiko Fukuyama, Masayuki Oguchi, Toshiba Nanoanalysis Corporation
7. Sample dependence on measured depth resolution for shallow boron profile
1Masum Obuchi, 1Naoki Sugita, 2Mitsuhiro Tomita,
1Analysis and Evaluation Center, Toshiba Nanoanalysis Corporation, 2Corporate Research & Development Center, Toshiba Corporation
17:00-19:00
Social Meeting
July 22, 2005
10:00-10:30
TOF-SIMS applications for biological materials – Imaging of cosmetic ingredients in human hair and tooth –
Masayuki Okamoto, Analytical Research Center, Kao Corporation
10:30-11:10
NanoBio-SIMS Applications for Organic/Bio-surface Analysis
Tae Geol Lee
Nano Surface Group, Korea Research Institute of Standards and Science (KRISS), Korea
11:10-11:50
TOF-SIMS Analysis of Surface Immobilized Biomolecules (tentative)
D. G. Castner University of Washington, USA
11:50-13:00
Lunch
13:00-13:30
Use of a C60 Ion Beam for Sputtering with Low Damage
Sanada Noriaki, Analytical Laboratory, ULVAC-PHI, Inc.
13:30-14:00
Sputtering effect of cluster ion beam produced from the metal cluster complex
T.Fujimoto, Y.Fujiwara, H.Nonaka, K.Kondo, Y.Teranishi, A.Kurokawa and S.Ichimura
National Institute of Advanced Industrial Science and Technology (AIST)
14:00-14:30
Deconvolution analysis of shallow junction boron profiles
1M. Tomita, 1 H. Tanaka, 1M. Koike, 1M. Yoshiki, 1S. Takeno, 1N. 2Sugita and 2M. Obuchi
1Corporate Research & Development Center, Toshiba Corporation, 2Analysis and Evaluation Center Ⅱ, Toshiba Nanoanalysis Corporation
2Corporate Research & Development Center, Toshiba Corporation
14:30-15:00
International standards for SIMS analysis
Akio Takano, NTT Advanced Technology Corporation
15:00-15:15
Break
15:15-15:55
Living body materials evaluation by SIMS
M. Schuhmacher, Cameca, France
15:55-16:25
Recent Developments and Applications of SIMS in ULVAC-PHI
Takahiro Hoshi and John Hammond, ULVAC-PHI
15:25-17:05
Recent Developments in Cluster Ion Gun Technology for Time-of-Flight SIMS
Derk Rading, Rudolf Mllers, Markus Terhorst, Felix Kollmer, and Ewald Niehuis,
ION-TOF GmbH, Germany