Program * Invited speaker
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June 10, 2010 (Thu.)
10:00 Opening remarks
M. Kudo Seikei univ.
10:05-12:15 [[ Dynamic SIMS session ]]
1* ” Towards the ultimate depth resolution limits in SIMS “
W. Vandervorst Interuniversity Microelectronics Center (IMEC)
2* “ Determination of interface position and layer thickness of multilayer films by composition depth profiling “
K. J. Kim Korea Research Institute of Standards and Science (KRISS)
3. “ Evaluation of atomic mixing for silicon atoms in silicon isotope superlattices under cesium and oxygen ion bombardments “
M. Tomita Toshiba Corporate Research & Development Center
4* ” Isotope analysis by SIMS and material processing “
H. Yurimoto Hokkaido Univ.
（ Instrument maker’s talk ）
5. ” Latest developments on NanoSIMS instrumentation for life science and materials “
F. Horréard CAMECA
(12:15-13:10 coffee break)
13:10-14:10 [[ Post-Ionization session ]]
1* ” Development of multi-turn TOF-SIMS system with a femto-second laser for post-ionization “
M. Ishihara Osaka Univ.
2* “ Detection of polymers using Laser SNMS “
T. Sakamoto Kougakuin Univ.
(14:10-14:25 coffee break)
14:25-16:25 [[ Atom probe session ]]
1* “ Depth profiling optimization using Atom Probe Tomography “
F. Vurpillot Univ. of Rouen
2* “ 3D-atom probe: facts, artifacts and applications in semiconductors “
W. Vandervorst Interuniversity Microelectronics Center (IMEC)
3. “ Atom Probe analysis of molecular system ”
M. Taniguchi Kanazawa Inst. of Technology
4. “ Recent progress in laser-assisted 3DAP and its application “
T. Okubo National Institute for Material Science (NIMS)
( Instrument maker’s talk )
5. ” Latest developments on 3D Atom Probe instrumentation for nanoscale elemental analysis “
F. Horréard CAMECA.
(16:25-16:40 break & transfer to next site)
16:40-18:00 [[ Poster session ]] (at Hall on the 12th floor, University Building #10)
P1. ” An analysis of the distribution of ferruginol in the heartwood-forming Cryptomeria japonica xylem using ToF-SIMS ”
K. Kuroda Forestry and Forest Products Research Institute
P2. ” Lignin distribution in the xylem of maple by TOF-SIMS molecular imaging ”
K. Saito Nagoya Univ.
P3. ” Simulation of fragmentation of polyethylene glycole by quantum molecular dynamics for TOF-SIMS spectral analysis ”
N. Kato Seikei Univ.
P4. ” TOF-SIMS study of the lipid layer (18-MEA) damage on the outermost hair surface ”
M. Okamoto Kao
P5. ” Emission of a Single Molecule by Argon-Cluster Bombardment behind a Suspended Graphene Sheet ”
S. Nakano Hyogo Univ.
P6. ” Nondestractive Analytical Area Navigation in TOF-SIMS using integrated SEM ”
K. Fujioka Kogakuin Univ.
P7. ” Image Analysis of Small Particles with a Combination of SEM and TOF-SIMS ”
H. Wada Kogakuin Univ.
P8. ” SIMS Analysis of Low dose As implantation in SiGe ”
Y.H. Huang GLOBALFOUNDRIES
P9. ” ToF-SIMS depth profile analysis of sodium in silicon oxide ”
D. Kobayashi AGC
P10. ” Effect of the uni-molecular dissociation of CsI cluster ions on the apparent mass in the TOF-SIMS of CsI ”
T. Nakanaga AIST
P11. ” Matrix effect-free depth profiling of multilayered Si/Ti with laser-SNMS ”
S. Nishinomiya Nippon Steel
17:00-19:00 Social meeting (at the same place of Poster session)
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June 11, 2010 (Thu.)
9:00-10:40 [[ Cluster Ion beams session ]]
1. ” Characteristics of the ion source for the electrospray droplet impact ionization method “
K. Hiraoka Univ. of Yamanashi
2. ” Soft-ionization SIMS by using argon cluster ions “
K. Mochiji Univ. of Hyogo
3. ” Availability of gas cluster SIMS to biomolecular analysis “
S. Ninomiya Univ. of Yamanashi
(10:20-10:35 coffee break)
10:35-12:05 [[ Theoretical approach session ]]
1* “ SIMS with cluster projectiles as seen by computer simulations ”
Z. Postawa Jagiellonian Univ.
2. “ Damage and sputtering with cluster impact by MD simulations “
T. Aoki Kyoto Univ.
3. “ A brief report on improving data by multivariate & informatics techniques “
S. Aoyagi Shimane Univ.
4. “ Dead time correction methods for the pulse counting detector “
A. Takano NTT Advanced Technology
(12:05-13:10 Lunch break)
13:10-14:50 [[ Maldi imaging session ]]
1* “Clinical application of metabolite imaging with MALDI and/or SIMS ”
M. Setou Hamamatsu Univ. School Med.
2* “Breakthrough in Mass spectrometry by superconducting molecule detector ”
M. Okubo Advanced Industrial Science and Technology (AIST)
(Instrument maker’s talks )
3. “ Small Molecular Imaging MS using MALDI-FT-ICR MS ”
K. Saitou Bruker Daltonics
4. “ Development of Mass Microscope ”
T. Harada Shimadzu
(14:50-15:05 coffee break)
15:05-17:35 [[ TOF-SIMS session ]]
1* ” TOF-SIMS for bio-analysis above and beyond the static limit “
J. S. Fletcher Univ. of Manchester
2* ” Investigations and comparisons on Multivariate Analyses for TOF-SIMS Image Analysis “
T. Kono Asahi Kasei
3* “ ToF SIMS study of semi-crystalline polymer surfaces ”
L. T. Weng Hong Kong Univ. of Sci. Technol.
4. “ Advances in 3D TOF-SIMS imaging of organics: from depth profiling to FIB sectioning ”
G. Fisher Physical Electronics
(Instrument maker’s talks )
5. “Recent progress and Application of Gas Cluster Ion Beam “
T. Miyayama Ulvac-phi
6. “ Recent TOF-SIMS developments at ION-TOF “
M. Terhorst ION-TOF
17:35-17:40 Closing remarks
S. Hayashi Nippon Steel