The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-12)
Scope:
SISS-12 will cover SIMS and related techniques based on ion-solid
interactions: fundamentals, instrumentation, and application in various fields,
such as semiconductors, industrial materials, biological, medical, and
environmental sciences. This symposium will be held as a post-conference of
SIMS-XVII. In this time, we will have mainly three sessions: Atom Probe, D-SIMS,
and TOF-SIMS.
Date:
June 10-11, 2010 10:00-17:00
Place: Meeting Room on the 4th floor, University Building #14,
Seikei University (Social meeting: June 10, 2010 17:20-19:00, Hall on the
12th floor, University Building #10)
Access to Seikei University in Tokyo

Accommodation:
Recommended Hotels
Registration will be opened by March.
Fee: 5,000 Yen (including social meeting
fee)
Program
Guideline for presenter:
All invited and contributed presenters are expected to write abstract paper.
Digital file (MS-Word file) should be sent by e-mail to the committee,
no later than May 21th, 2010. The abstract should be accompanied by a cover
letter stating the title, name, address, e-mail address. The format requires
A4 page (No page limitation).
Contact us:Organizing
Committee Dr. Syunich
Hayashi (Nippon steel)
E-mail: hayashi.shunichi*nsc.co.jp
(Please replace ''*' to '@' in the address.)
Committee:
Organizing
Committee |
|
Chair: Masahiro Kudo |
Seikei
University |
Syunichi Hayashi |
Nippon Steel |
Program Coordinators |
|
Akio Takano |
NTT-AT |
Atsushi Murase |
Toyota Central R&D Labs. |
Masashi Nojima |
Tokyo University of Science |
Mitsuhiro Tomita |
Toshiba |
Nobuhiko Kato |
Seikei
University |
Satoka
Aoyagi |
Shimane University |
Teiichiro Kono |
Asahi Kasei |
Manabu
Komatsu |
Canon |
|