We are pleased to announce that the 22nd International Conference on Secondary Ion Mass Spectrometry – SIMS-22 will be held in a historical city of Kyoto, Japan, from 20 to 25 October 2019.
The conference will provide a forum for colleagues from both academia and industries throughout the world to exchange results and new ideas on Secondary Ion Mass Spectrometry and related techniques.
A global forum for researchers and users from academia, research organizations and industries to exchange results and new ideas on Secondary Ion Mass Spectrometry and related techniques. The conference will cover advancements of scientific knowledge from fundamental understanding to new applications. Discussion on present possibilities and future developments of the technique, in view of the future requirements coming from technology and basic research, will be particularly solicited also with dedicated discussion sessions.
An All-day Special Session/Workshop entitled “Frontiers and Challenges in Industrial SIMS“ will be held on the use of SIMS in applied materials research with emphasis on industrial applications.
We cordially invite you to attend SIMS-22 in Kyoto. We believe that you will enjoy not only the scientific presentation and discussion during the conference, but also a historical city with its outstanding beautiful nature and traditional culture.
SIMS-22 will be held in conjunction with the 12th International Symposium on Atomic Level Characterization for New Materials and Devices ’19 (ALC ’19).
As in past conferences, the conference will also be preceded by one day of tutorials (Sunday, 20 October) and a welcome reception.