Invited Speakers

Invited Speakers

Dr. Tina Angerer (University of Washington, USA)
“Identifying lipids in standards and tissue sections by studying fragmentation patterns in ToF-SIMS imaging”


Prof. Laetitia Bernard (EMPA, Switzerland)
“Functional polymers: Where the good old Cs+ can help”



Dr. Birgit Hagenhoff (TASCON, Germany)


Prof. Andrew Ewing (University of Gothenburg, Sweden)
“Probing the Structure of Single Neurotransmitter Vesicles with NanoSIMS”

Dr. Alexis Franquet (IMEC, Belgium)
“A holistic approach of SIMS analysis for advanced semiconductor structures”



Prof. John Fletcher (University of Gothenburg, Sweden)
“Bigger beams; better bio-analysis?”


Prof. Ian Gilmore (National Physical Laboratory, UK)
“Critical review of advances in high-resolution mass spectrometers and their utility for SIMS”


Dr. Anja Henss (Justus Liebig University, Germany)
“Interface analysis of next-generation battery materials”


Dr. Sabine Hirth (BASF, Germany)
“When dwarfs rule giants: Surface Characterization in BASF as an example for the Chemical Industry”



Prof. Haibo Jiang (University of Western Australia, Australia)


Dr. Jae Cheol Lee (Samsung Electronics, Korea)
“Wide applications of SIMS in industry”


Dr. Jang Jung Lee (TSMC, Taiwan)
“Challenges in Semiconductor Material Analysis”



Prof. Johan Lindgren (Lund University, Sweden)
“A novel multi-technique approach reveals the softer side of ancient ‘sea monsters'”


Prof. Xian-Hua Li (Chinese Academy of Sciences, China)
“Ultra-high precision Si isotope analysis using Cameca-1280 SIMS”


Prof. Nicholas Lockyer (University of Manchester, UK)



Dr. Shin Muramoto (NIST, USA)
“Surface and Trace Chemical Analysis – Imaging Mass Spectrometry for Homeland Security and Forensics”



Dr. Takemichi Nakamura (Riken, Japan)
“Do we have chemistry? MS/MS in anticipation or in reality”


Dr. Mark Nicholas (AstraZeneca, Sweden)

Dr. Nina Ogrinc Potocnik (University of Lille, France)
“Under construction: Increasing ionization efficiencies of intact biomolecules from tissues”



Prof. Toshio Seki (Kyoto University, Japan) 
“MeV-SIMS Measurements under Ambient and Humid Conditions”


Prof. Jonathan Sweedler (University of Illinois, USA)

Prof. Philippe Walter (CNRS-Université Pierre et Marie Curie, France)
“New perspectives of ToF-SIMS imaging for Art History and Conservation of paintings”



Keynote Speakers for Industrial Session

Dr. Temel Buyuklimanli (EAG, USA)

Dr. Christine Mahoney (Corning, USA)
“ToF-SIMS Analysis of Thin Films and Coatings on Glass: Applications of a new tool to help better understand challenging problems”


Dr. Takaharu Nagatomi (Asahikasei, Japan)

Dr. William Stickle (HP, USA)