Invited Speakers

Invited Speakers

Dr. Tina Angerer (University of Washington, USA)

Prof. Laetitia Bernard (EMPA, Switzerland)

Dr. Birgit Hagenhoff (TASCON, Germany)
 (TBD…)

 

Prof. Andrew Ewing (University of Gothenburg, Sweden)

Dr. Alexis Franquet (IMEC, Belgium)

Prof. John Fletcher (University of Gothenburg, Sweden)

Prof. Ian Gilmore (National Physical Laboratory, UK)

Prof. Anja Henss (Justus Liebig University, Germany)

Dr. Sabine Hirth (BASF, Germany)

Prof. Haibo Jiang (University of Western Australia, Australia)

Dr. Jae Cheol Lee (Samsung Electronics, Korea)

Dr. Jang Jung Lee (TSMC, Taiwan)

Prof. Johan Lindgren (Lund University, Sweden)

Prof. Xian-Hua Li (Chinese Academy of Sciences, China)

Prof. Nicholas Lockyer (University of Manchester, UK)

Dr. Shin Muramoto (NIST, USA)

Dr. Takemichi Nakamura (Riken, Japan)

Dr. Mark Nicholas (AstraZeneca, Sweden)

Dr. Nina Ogrinc Potocnik (University of Lille, France)

Prof. Toshio Seki (Kyoto University, Japan) 
“MeV-SIMS Measurements under Ambient and Humid Conditions”

 

Prof. Jonathan Sweedler (University of Illinois, USA)

Prof. Philippe Walter (CNRS-Université Pierre et Marie Curie, France)

Keynote Speakers for Industrial Session

Dr. Temel Buyuklimanli (EAG, USA)

Dr. Christine Mahoney (Corning, USA)
 
“ToF-SIMS Analysis of Thin Films and Coatings on Glass: Applications of a new tool to help better understand challenging problems”

 

Dr. Kathryn Lloyd (DuPont, USA)

Dr. Takaharu Nagatomi (Asahikasei, Japan)

Dr. William Stickle (HP, USA)