June 23, 2011 (Thu)
12:25- Opening remarks
High sensitive detection by laser ionization 12:30-13:40
Matrix effect-free depth profiling of multilayered samples by resonance enhanced multiphoton ionization sputtered neutral mass spectrometry
S. Nishinomiya, N. Kubota, S. Hayashi and H. Takenaka
Multi-element quantitative analysis of Genesis solar wind collectors with Resonance Ionization Mass Spectrometer (Invited talk)
I. Veryovkin
Laser Post-Ionization Secondary Neutral Mass Spectrometry for nanometer scale materials characterization
I. Veryovkin
(Break)
D-SIMS 13:50-15:50
Precise baddeleyite Pb/Pb and U/Pb isotopic age Determination by Cameca 1280 SIMS (Invited talk)
X.-H. Li, Q.-L. Li, Y. Liu, G.-Q. Tang and J.-H. Yang
SIMS analysis of extraterrestrial materials including the HAYABUSA mission samples (Invited talk)
H. Yurimoto
SIMS Depth Profiling of Ultra-shallow Implants with Oxygen Primary Ions (Invited talk)
Y. Kataoka
Vender session: CAMECA
M. Schuhmacher
(Break)
TOF-SIMS 16:00-17:30
ToF-SIMS Imaging Analysis of Biological Samples (Invited talk)
T. G. Lee
Application of TOF-SIMS to the direct determination of plant components and introduction of CryoTOF-SIMS/SEM complex apparatus (Invited talk)
K. Fukushima, K. Saito and K. Kuroda
Vender session: ION-TOF “Recent TOF-SIMS and LEIS Developments at ION-TOF”
M. Terhorst
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June 23, 2011 (Thu)
Poster session 17:30-19:00
P-1. TOF-SIMS discrimination of PE / PP thin contamination using multivariate analysis
K. Usugi,
P-2. TOF-SIMS Analysis of Boron and Nitrogen in Steels
K. Kusama, S. Naya, R. Sato and N. Usuki
P-3. An effect of measurement conditions on the depth resolution for TOF-SIMS depth profiling
A. Murase, T. Mitsuoka, M. Tomita, H.Nonaka, H. Takenaka, and H.Morita
P-4. Characterization of the protein damages on the outermosthair surface using TOF-SIMS
M. Okamoto, K. Ishikawa, N. Tanji and S. Aoyagi
P-5. A New Time of Flight SIMS Instrument for3-Dimensional Imaging and Analysis Using Cluster Ion Beams
R. Hill, R. Oiwa, J. S. Fletcher and J. C. Vickerman
P-6. Continuous and Automatic Imaging Analysis on Cutting Cross-Sections of Particulate Matters by FIB-TOF-SIMS
Takahiro Kashiwagi, J. Nakagawa, T. Sakamoto
P-7. Converging of argon cluster ion beams with a glass capillary
K. Shoji, K. Iuchi, K. Moritani, N. Inui, and K. Mochiji
P-8. Ion Bean Stimulated Desorption
T. Kobayashi, S. Toda,Y. Kuwahara and K. Ueda
P-9. Light emission from sputtered or backscattered atoms on tungsten surfaces irradiated by Kr+ ions
N. Nogami, K. Furuya, D. Kato, T. Kenmotsu, K. Motohashi, Y. Sakai, and H. A. Sakaue
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June 24, 2011 (Fri)
Atom Probe 10:00-11:20
Anomalous distribution in atom probe tomography data of solute carbon in ferrous steel
Y. Kobayashi, J. Takahashi and K. Kawakami
Combined Analyses of Atom probe tomography and nano-SIMS for the Interface Segregation in Steels (Invited talk)
C. G. Park
Vender session: CAMECA
P. Clifton
(Break)
Novel primary ion beam 11:30-12:20
High sensitive SIMS with electrospray droplet impact method
S. Ninomiya, L.C. Chen, Y. Sakai and K. Hiraoka
Ambient surface mass spectrometry – developing the metrology for reliable and repeatable measurement (Invited talk)
I. Gilmore
(12:20-13:20 Lunch)
G-SIMS 13:20-14:10
Investigation of G-SIMS Analysis for PEG samples
I. Mihara, M. Kudo and S. Aoyagi
Watching chemistry in 3D & hi-definition using SIMS – from nanostructures to informatics (Invited talk)
I. Gilmore
Cluster Ion Beam 14:10-16:30
Surface sensitive analysis of organic thin films by Ar-gas cluster SIMS
K. Moritani, N. Inui, K. Mochiji
Organic Depth Profiling Using Cluster Beams: C60 and Large Ar Clusters
D. Rading, R. Moellers, M. Terhorst, E. Niehuis
(Break)
Organic and Biological Material Analysis with Cluster Ion Beams (Invited talk)
J. Matsuo
Clinical applications of SIMS and MALDI-IMS (Invited talk)
M. Setou
Vender session: UIVAC-PHI
T. Miyayama
16:30- Closing remarks