SISS08 program



July 21, 2005


Opening remarks

Masahiro Kudo, Faculty of Science and Technology, Seikei University



A Novel Pretreatment Technique of Environmental Samples using Supercritical Fluids for TOF-SIMS Analysis

1Tetsuo Sakamoto, 2,3Masanori Owari and 4Yoshimasa Nihei

1Faculty of Engineering, Kogakuin University, 2Environmental Science Center, the University of Tokyo, 3Institute of Industrial Science, the University of Tokyo, 4Faculty of Science and Technology, Tokyo University of Science





Development of Multi-turn Mass Spectrometers

Morio Ishihara, Graduate School of Science, Osaka University



Development of Isotope-Microscopy and Implications for Earth and Planetary Science

Hisayoshi Yurimoto, Division of Earth and Planetary Sciences, Hokkaido University






SIMS Molecular Surgery: Recognition of Surface Bonding Structures and Reaction Mechanisms

Che-Chen Chang, Department of Chemistry, National Taiwan University, Taiwan



Enhanced Peptide Molecular Imaging by Applying of Droplet Including Ionization-Promoting Agent and Their Quantitative Detection with Bubble Jet Printing Technology

Manabu Komatsu, Youhei Murayama and Hiroyuki Hashimoto

Advanced Analysis Div., Leading-Edge Technology Development Headquarters, Canon inc.






Poster session

1. TOF-SIMS Analysis of Friction Surfaces Tested in Engine Oil

Atsushi Murase, Hiroyuki Mori and Toshihide Ohmori

Toyota Central R&D Labs., Inc. (Toyota CRDL)


2. Reduction of matrix effects in TOF-SIMS analysis by silver deposition/TOF-SIMS

M. Inoue, A. Murase, Toyota Central R&D Labs., Inc.





3. Simulation of SIMS for Polymers under the Assumption of Thermal Decomposition using QMD Method

K. Endo, T.Ida, N. Kato, H. Sugimoto and D. Matsumoto

Laboratory of Theoretical Chemistry, Graduate School of Natural Science and Technology, Kanazawa University


4. Evaluation of secondary ion yield enhancement from polymer material by using TOF-SIMS equipped with a gold cluster ion source

Kenichi Aimoto, Satoka Aoyagi, Nobuhiko Kato, Noriko Iida, Akira, Yamamoto, Masahiro Kudo, Faculty of Science and Technology, Seikei University

5. Estimation of protein distribution by mean of principal component analysis (PCA) of TOF-SIMS spectra

S. Hoshi, Satoka Aoyagi, Nobuhiko Kato, Masahiro Kudo, Faculty of Science and Technology, Seikei University


6. Applications by TOF-SIMS method for Electronic device materials

Hiroyuki Maeda, Sachiko Fukuyama, Masayuki Oguchi, Toshiba Nanoanalysis Corporation


7. Sample dependence on measured depth resolution for shallow boron profile

1Masum Obuchi, 1Naoki Sugita, 2Mitsuhiro Tomita,

1Analysis and Evaluation Center, Toshiba Nanoanalysis Corporation, 2Corporate Research & Development Center, Toshiba Corporation



Social Meeting



July 22, 2005


TOF-SIMS applications for biological materials – Imaging of cosmetic ingredients in human hair and tooth –

Masayuki Okamoto, Analytical Research Center, Kao Corporation






NanoBio-SIMS Applications for Organic/Bio-surface Analysis

Tae Geol Lee

Nano Surface Group, Korea Research Institute of Standards and Science (KRISS), Korea



TOF-SIMS Analysis of Surface Immobilized Biomolecules (tentative)

D. G. Castner University of Washington, USA






Use of a C60 Ion Beam for Sputtering with Low Damage

Sanada Noriaki, Analytical Laboratory, ULVAC-PHI, Inc.



Sputtering effect of cluster ion beam produced from the metal cluster complex

T.Fujimoto, Y.Fujiwara, H.Nonaka, K.Kondo, Y.Teranishi, A.Kurokawa and S.Ichimura

National Institute of Advanced Industrial Science and Technology (AIST)



Deconvolution analysis of shallow junction boron profiles

1M. Tomita, 1 H. Tanaka, 1M. Koike, 1M. Yoshiki, 1S. Takeno, 1N. 2Sugita and 2M. Obuchi

1Corporate Research & Development Center, Toshiba Corporation, 2Analysis and Evaluation Center Ⅱ, Toshiba Nanoanalysis Corporation

2Corporate Research & Development Center, Toshiba Corporation



International standards for SIMS analysis

Akio Takano, NTT Advanced Technology Corporation







Living body materials evaluation by SIMS

M. Schuhmacher, Cameca, France



Recent Developments and Applications of SIMS in ULVAC-PHI

Takahiro Hoshi and John Hammond, ULVAC-PHI



Recent Developments in Cluster Ion Gun Technology for Time-of-Flight SIMS

Derk Rading, Rudolf Mllers, Markus Terhorst, Felix Kollmer, and Ewald Niehuis,

ION-TOF GmbH, Germany