The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-12)
SISS-12 will cover SIMS and related techniques based on ion-solid interactions: fundamentals, instrumentation, and application in various fields, such as semiconductors, industrial materials, biological, medical, and environmental sciences. This symposium will be held as a post-conference of SIMS-XVII. In this time, we will have mainly three sessions: Atom Probe, D-SIMS, and TOF-SIMS.
Date: June 10-11, 2010 10:00-17:00
Place: Meeting Room on the 4th floor, University Building #14, Seikei University (Social meeting: June 10, 2010 17:20-19:00, Hall on the 12th floor, University Building #10)
Access to Seikei University in Tokyo
Registration will be opened by March.
Fee: 5,000 Yen (including social meeting fee)
Guideline for presenter:
All invited and contributed presenters are expected to write abstract paper. Digital file (MS-Word file) should be sent by e-mail to the committee, no later than May 21th, 2010. The abstract should be accompanied by a cover letter stating the title, name, address, e-mail address. The format requires A4 page (No page limitation).
Contact us:Organizing Committee Dr. Syunich Hayashi (Nippon steel)
|Chair: Masahiro Kudo
||Toyota Central R&D Labs.
||Tokyo University of Science