The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-12)

SISS-12 will cover SIMS and related techniques based on ion-solid interactions: fundamentals, instrumentation, and application in various fields, such as semiconductors, industrial materials, biological, medical, and environmental sciences. This symposium will be held as a post-conference of SIMS-XVII. In this time, we will have mainly three sessions: Atom Probe, D-SIMS, and TOF-SIMS.

Date: June 10-11, 2010    10:00-17:00

Place: Meeting Room on the 4th floor, University Building #14, Seikei University (Social meeting: June 10, 2010 17:20-19:00, Hall on the 12th floor, University Building #10)

Access to Seikei University in Tokyo

Registration will be opened by March.

Fee:    5,000 Yen (including social meeting fee)


Guideline for presenter:

All invited and contributed presenters are expected to write abstract paper. Digital file (MS-Word file) should be sent by e-mail to the committee, no later than May 21th, 2010. The abstract should be accompanied by a cover letter stating the title, name, address, e-mail address. The format requires A4 page (No page limitation).

Contact us:Organizing Committee Dr. Syunich Hayashi (Nippon steel)



Organizing Committee
Chair: Masahiro Kudo Seikei University
Syunichi Hayashi Nippon Steel
Program Coordinators
Akio Takano NTT-AT
Atsushi Murase Toyota Central R&D Labs.
Masashi Nojima Tokyo University of Science
Mitsuhiro Tomita Toshiba
Nobuhiko Kato Seikei University
Satoka Aoyagi Shimane University
Teiichiro Kono Asahi Kasei
Manabu Komatsu Canon